OptoPrism Coupler
▶Measurement Accuracy
±0.0005
▶ Refractive Index Resolution
±0.0003
▶Multiple Wavelengths Available
266-1650nm
Product Series
FA/VG/MT High Precision Measurement System
3σ<0.1μm
Adapt to all scenarios including process inspection during production line operation, full inspection upon factory release, and incoming material quality inspection
Optical passive component AOI inspection equipment
Sub-micron level precision
Self-developed AI image detection algorithm
Efficient and intelligent mass production
Prism Coupler
Refractive Index & Film Thickness &
Waveguide Loss measurement
accuracy ±0.0005, wavelengths 266-1650nm
Film Thickness Analyzer
A rapid film thickness detection scheme for transparent films, optical adhesive layers and composite films
We sincerely provide you with personalized optical solutions
Solution
Optical communication
Semiconductor
Laser
Medical
Military
Aerospace